Gas
Sensors
Laboratory

Papers

HOME > Publications > Papers
16 (SCIE) Hyoun-Woo Kim*, Byong-Sun Ju, Chang-Jin Kang, Joo-Tae Moon, Patterning of W/WNx/poly-Si gate electrode using Cl2/O2 plasmas, Microelectronic Engineering 65 (2003.03) 285-292.
15 (SCIE) J. H. Lee, W. J. Choi*, Y. J. Park, I. K. Han, J. I. Lee, J. W. Cho, E. K. Kim, C. M. Lee, H.-W. Kim, Thermal Treatment of InGaAs/GaAs Self-assembled Quantum Dots With SiNx and SiO2 Capping Layers, Journal of the Korean Physical Society 42 (2003.02) S313-S315.
14 (SCIE) Kwang-Sik Kim, Hyoun Woo Kim*, Structural Characterization of ZnO Thin Film Grown on Si-Based Substrates by Metal Organic Chemical Vapor Deposition, Journal of the Korean Physical Society 42 (2003.02) S149-S152.
13 (SCIE) Hyoun-Woo Kim*, Byong-Sun Ju, Chang-Jin Kang, Joo-Tae Moon, A study on the Pt electrode etching for 0.15 μm technologies, Microelectronic engineering 65 (2003.01) 185-195.
12 (SCIE) Hyoun Woo Kim*, Jae-Hyun Han, Byong-Sun Ju, Chang-Jin Kang, Joo-Tae Moon, Study of Ru etching using O2/Cl2 helicon plasmas, Materials Science and Engineering: B 95 (2002.09.01) 249-253.
11 (SCIE) Cheol Jin Lee*, Seung Chul Lyu, Hyoun-Woo Kim, Jong Wan Park, Hyun Min Jung, Jaiwook Park, Carbon nanotubes produced by tungsten-based catalyst using vapor phase deposition method, Chem. Phys. Lett. 361 (2002.08.06) 469-472.
10 (SCIE) Cheol Jin Lee*, Seung Chul Lyu, Hyoun-Woo Kim, Jin Ho Lee, Kyoung Ik Cho, Synthesis of bamboo-shaped carbon–nitrogen nanotubes using C2H2–NH3–Fe(CO)5 system, Chemical Physics Letters 359 (2002.06.13) 115-120.
0 9 (SCIE) Cheol Jin Lee*, Seung Chul Lyu, Hyoun-Woo Kim, Chong-Yun Park, Cheol-Woong Yang, Large-scale production of aligned carbon nanotubes by the vapor phase growth method, Chemical Physics Letters 359 (2002.06.13) 109-114.
0 8 (SCIE) Hyoun-woo Kim, Byong-Sun Ju, Byeong-Yun Nam, Won-Jong Yoo, Chang-Jin Kang, Tae-Hyuk Ahn, Joo-Tae Moon, Moon-Yong Lee, High temperature platinum etching using Ti mask layer, Journal of Vacuum Science & Technology A 17 (1999.07.08) 2151-2155.
0 7 (SCIE) Hyoun-woo Kim*, Rafael Reif, Ex situ wafer surface cleaning by HF dipping for low temperature silicon epitaxy, Thin Solid Films 305 (1997.08) 280-285.