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0 3 Z.H.Zhou*, I.Yang, H.Kim, F.Yu, Rafael Reif, Real time in situ epitaxial film thicknessminitoring and control using an emission Fourier transform infrared spectrometer, J.Vac.Sci.Tech.A 12 (1994.7/8) 1938-1942.
0 2 Noboru Nakano*, Louis Marville, Syun-Ming Jang. Kenneth Liao. Cutis Tsai. Julie Tsai,Hyoun-woo Kim, Rafael Reif, Effect of thermal annealing on the Raman spectrum of SiGe grown on Si, J. Appl. Phys. 73 (1993.01.01) 414-417.
0 1 Syun-Ming Jang*, Hyoun-woo Kim, Rafael Reif. Thermal stability ofSi/SiGe/Si heterostructures deposited by very low pressure chemical vapor deposition, Appl. Phys. Lett. 61 (1992.07.20) 315-317.