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66 (SCIE) Hyoun Woo Kim*, Nam Ho Kim, Chongmu Lee, Annealing effects on the structural and optical properties of gallium oxide nanowires, Journal of Materials Science: Materials in Electronics 16 (2005.02) 103-105.
65 (SCIE) Hyoun Woo Kim*, Surface Cleaning Effects of Silicon Substrates by ECR Hydrogen Plasma on Subsequent Homoepitaxial Growth, Materials Science Forum 475-479 (2005.01.15) 4067-4070.
64 (SCIE) Kyung Chul Lee, Nam Ho Kim, Beom-Hoan O, Hyoun Woo Kim*, Annealing Effects on the Structural Properties of Gold Films on Si by the RF Magnetron Sputtering, Materials Science Forum 475-479 (2005.01.15) 3923-3926.
63 (SCIE) Nam Ho Kim, Hyoun Woo Kim*, MOCVD Growth and Annealing of Gallium Oxide Thin Film and Its Structural Characterization, Materials Science Forum 475-479 (2005.01.15) 3377-3380.
62 (SCIE) Ju Hyun Myung, Nam Ho Kim, Hyoun Woo Kim*, Structural Properties of Sputter-Deposited ZnO Thin Films Depending on the Substrate Materials, Materials Science Forum 475-479 (2005.01.15) 1825-1828.
61 (SCIE) Nam Ho Kim, Ju Hyun Myung, Hyoun Woo Kim*, Chongmu Lee, Growth of In2O3 thin films on silicon by the metalorganic chemical vapor deposition method, Physica Status Solidi (a) 202 (2005.01) 108-112.
60 (SCIE) Hyoun Woo Kim*, Nam Ho Kim, Jae-Hyun Shim, Nam-Hee Cho, Chongmu Lee, Catalyst-free MOCVD growth of ZnO nanorods and their structural characterization, Journal of Materials Science: Materials in Electronics 16 (2005.01) 13-15.
59 (SCIE) Hyoun Woo Kim*, Investigation of a Cu-Zn-Al alloy with two-way shape memory effect by the cycled constrained heating/cooling technique, Journal of Materials Science 40 (2005.01.15) 211-212.
58 (SCIE) Hyoun Woo Kim*, Effect of in-situ cleaning temperature on the structural quality of homoepitaxial film on Si substrate, Journal of Materials Science 39 (2004.11) 6861-6862.
57 (SCIE) Hyoun Woo Kim*, Nam Ho Kim, Preparation of GaN films on ZnO buffer layers by rf magnetron sputtering, Applied Surface Science 236 (2004.09.15) 192-197.