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44 (SCIE) Jongmin Lim, Kyoungchul Shin, Hyoun Woo Kim, Chongmu Lee*, Effect of annealing on the photoluminescence characteristics of ZnO thin films grown on the sapphire substrate by atomic layer epitaxy, Materials Science and Engineering: B 107 (2004.03.25) 301-304.
43 (SCIE) Hyoun Woo Kim*, Vertical Etching of Ru Electrodes Using the O2/Cl2 System, Materials Science Forum 449-452 (2004.03) 357-360.
42 (SCIE) Hyoun Woo Kim*, Plasma Etching for Fabricating the Concave-Type DRAM Capacitors, Materials Science Forum 449-452 (2004.03) 353-356.
41 (SCIE) S. M. Kang, T. J. Eom, S. J. Kim, H. W. Kim, J. Y. Cho, Chongmu Lee*, Reverse recovery characteristics and defect distribution in an electron-irradiated silicon p-n junction diode, Materials Chemistry and Physics 84 (2004.03) 187-191.
40 (SCIE) Hyoun Woo Kim*, Nam Ho Kim, Annealing effect for structural morphology of ZnO film on SiO2 substrates, Materials Science in Semiconductor Processing 7 (2004.02~04) 1-6.
39 (SCIE) N. H. Kim, H. W. Kim*, Room temperature preparation of c axis oriented ZnO films on Si(100), SiO2, and ZnO substrates by rf magnetron sputtering, British Ceramic Transactions 103 (2004.02) 15-18.
38 (SCIE) Nam Ho Kim, Hyoun Woo Kim*, Room temperature growth of zinc oxide films on Si substrates by the RF magnetron sputtering, Materials Letters 58 (2004.02) 938-943.
37 (SCIE) Hyoun Woo Kim*, Nam Ho Kim, Chongmu Lee, Ji-ho Ryu, Nae Eung Lee, Very Low Temperature Growth of ZnO Thin Films on Si Substrates Using the Metalorganic Chemical Vapor Deposition Technique, Journal of the Korean Physical Society 44 (2004.01.15) 14-17.
36 (SCIE) Hyoun Woo Kim*, Nam Ho Kim, Influence of the substrate on the structural properties of sputter-deposited ZnO films, Physica Status Solidi (a) 201 (2004.01) 235-238.
35 (SCIE) Hyoun Woo Kim*, Effect of surface carbon and oxygen on the structural quality of silicon homoepitaxial films, Journal of Materials Science 39 (2004.01) 361-363.