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14 |
(SCIE) Hyoun Woo Kim*, Nam Ho Kim, Annealing effects on the properties of Ga2O3 thin films grown on sapphire by the metal organic chemical vapor deposition, Applied Surface Science 230 (2004.05.31) 301-306. |
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13 |
(SCIE) Taejong Eom, Hyoun Woo Kim, Chongmu Lee*, ECR Plasma Precleaning for RuO2 MOCVD, Journal of the Korean Physical Society 44 (2004.05.15) 1083-1087. |
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12 |
(SCIE) Hyoun Woo Kim*, Nam Ho Kim, Chongmu Lee, Growth of Ga2O3 thin films on Si(100) substrates using a trimethylgallium and oxygen mixture, Journal of Materials Science 39 (2004.05) 3461-3463. |
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11 |
(SCIE) Nam Ho Kim, Hyoun Woo Kim*, Room temperature growth of high quality ZnO thin film on sapphire substrates, Journal of Materials Science 39 (2004.05) 3235-3236. |
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10 |
(SCIE) Jongmin Lim, Kyoungchul Shin, Hyoun Woo Kim, Chongmu Lee*, Effect of annealing on the photoluminescence characteristics of ZnO thin films grown on the sapphire substrate by atomic layer epitaxy, Materials Science and Engineering: B 107 (2004.03.25) 301-304. |
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0 9 |
(SCIE) Hyoun Woo Kim*, Vertical Etching of Ru Electrodes Using the O2/Cl2 System, Materials Science Forum 449-452 (2004.03) 357-360. |
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0 8 |
(SCIE) Hyoun Woo Kim*, Plasma Etching for Fabricating the Concave-Type DRAM Capacitors, Materials Science Forum 449-452 (2004.03) 353-356. |
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0 7 |
(SCIE) S. M. Kang, T. J. Eom, S. J. Kim, H. W. Kim, J. Y. Cho, Chongmu Lee*, Reverse recovery characteristics and defect distribution in an electron-irradiated silicon p-n junction diode, Materials Chemistry and Physics 84 (2004.03) 187-191. |
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0 6 |
(SCIE) Hyoun Woo Kim*, Nam Ho Kim, Annealing effect for structural morphology of ZnO film on SiO2 substrates, Materials Science in Semiconductor Processing 7 (2004.02~04) 1-6. |
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0 5 |
(SCIE) N. H. Kim, H. W. Kim*, Room temperature preparation of c axis oriented ZnO films on Si(100), SiO2, and ZnO substrates by rf magnetron sputtering, British Ceramic Transactions 103 (2004.02) 15-18. |
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